dBm Optics combines best-in-the-industry measurement technology with proprietary techniques for reducing or eliminating system errors for a line of comprehensive component characterizers which are unparalleled. Our component characterizers are used around the world by leading component suppliers.
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PDL Meter: PDL/IL/ORL (Model 4600)
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PDL/IL/ORL
The Model 4600 PDL Meter will characterize loss, polarization dependency and return loss, quickly, accurately, and with repeatability — all at an affordable cost.
Multi-Channel Capability
The Model 4600 PDL Meter can be configured with internal switching and/or multiple channels to allow testing of multi-channel and multi-DUT component testing.
- IL and ORL simultaneously measured in less than 1 second over a 100 nm band
- IL, ORL and PDL simultaneously measured in less than 8.5 seconds over a 100 nm band
- > 100 dB total dynamic range; > 65 dB dynamic range at full speed
- Low PDL error and high repeatability
- Real-time referencing reduces test time and increases accuracy
- Built-in fixed wavelength sources, typically 980 nm, 1310 nm, 1490 nm, 1550 nm, 1625 nm
(other wavelengths also available) - Built-in or external polarization controller
- Large color display makes data visualization and analysis simple
- Communicate over GPIB or Ethernet
- Exchange data using a USB flash drive
- 1 or 2 channels
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Swept Spectrometer® (Model 4650)
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Fast, Accurate Swept IL/PDL/ORL
The 4650 Swept Spectrometer® will characterize loss, polarization dependency and return loss as a function of wavelength, with accuracy and repeatability—all at an affordable cost. dBm Optics’ technology supports unprecedented optical repeatability, accuracy, and speed. A device can be characterized over a 100 nm span at 1 pm resolution with 1 pm and 0.005 dB accuracy in less than 1 second.
- IL and ORL simultaneously measured in less than 1 second over a 100 nm band
- IL, ORL and PDL simultaneously measured in less than 8.5 seconds over a 100 nm band
- > 100 dB total dynamic range; > 65 dB dynamic range at full speed
- Low PDL error and high repeatability
- Real-time referencing reduces test time and increases accuracy
- Built-in or external TLS or fixed wavelength sources
- Built-in or external polarization controller
- PDL Measurement in less than 8½ seconds
- Large color display makes data visualization and analysis simple
- Communicate over GPIB or Ethernet
- Exchange data using a USB flash drive
- 1 or 2 channels
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Component Spectrum Analyzer® (Model 2004)
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Fast, Accurate, Flexible Swept IL/PDL/ORL
The Model 2004 Component Spectrum Analyzer%reg; (CSA) will characterize loss, polarization dependency and return loss quickly with accuracy and repeatability—all at an affordable cost. Characterize a device over 100 nm at 1 pm resolution with 1 pm and 0.005 dB accuracy in <1 second. Many functions can be added to the CSA system, including dispersion measurement, digital I/O and tunable lasers.
- IL and ORL simultaneously measured in less than 1 second over a 100 nm band
- IL, ORL and PDL simultaneously measured in less than 8.5 seconds over a 100 nm band
- > 100 dB total dynamic range; > 65 dB dynamic range at full speed
- Low PDL error and high repeatability
- Real-time referencing reduces test time and increases accuracy
- Built-in or external TLS or fixed wavelength sources
- Built-in or external polarization controller
- Large color display makes data visualization and analysis simple
- Communicate over GPIB or Ethernet
- Exchange data using a USB flash drive
- 1-40 or up to 1500 channels
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Photodiode Characterizer (Model 4700)
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Complete Photodiode Measurement System
The Model 4700 Photodiode Characterizer is a complete photodiode test system. It will characterize PDs or APDs without the need for additional power supplies. It is this simple: Connect your device and press start. dBm Optics’ precision measurement technology allows very high current resolution and accuracy to capture dark currents and precise responsivity data.
- Simultaneous responsivity, PDR, and return loss measurement across wavelength
- Measure linearity to < 0.05 dB
- Cover telecom photodiode wavelengths 800-1700 nm
(pumps, O-, E-, S-, C-, L- and U-band) with a TLS, and 200-2000 nm with a monochrometer - Measure directly from the photodiode, or 0-10V from a transimpedance amplifier
- Test embedded PD in amplifiers simultaneous with optical parametric tests
- Great absolute accuracy, measurements down to < 200 fA
- > 100 dB total dynamic range
- Confirm polarization dependent responsivity to < 0.005 dB
- Linearity measurement to +/-0.05dB
- High-speed measurement: 100,000 rps
- Large color display makes data visualization and analysis simple
- Communicate over GPIB or Ethernet
- Exchange data using a USB flash drive
- 1 or 2 channels
- Testing integrated photodiodes in devices like triplexers and diplexers
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© 2003-2006 dBm Optics, Incorporated. All Rights Reserved. |
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