The Model 4650 Swept Spectrometer™ will characterize loss, polarization dependency and return loss quickly, accurately and repeatably—all at an affordable cost.
dBm Optics’ technology supports unprecedented optical repeatability, accuracy, and speed. A device can be characterized over a 100 nm span at 1 pm resolution with 1 pm and 0.015 dB accuracy in less than 1 second.
Loss measurements normally require a reference measurement—then a measurement of the loss. The Model 4650 entirely eliminates the need for the reference measurement by using a proprietary real-time reference. The Model 4650 is constantly monitoring the input power to the device and calculating the loss based on the power out of the device. In addition to speeding the measurement and eliminating the reference errors, the Model 4650 eliminates the effect of variation in the source power between the reference and the loss measurement. The result: the most accurate loss measurements available anywhere.
The PDL meter function of the Model 4650 performs fast and accurate measurement of the polarization dependency of the device using either all-state or matrix method. The matrix method will characterize 100,000 points of PDL in approximately 1 second.
High dynamic range allows the Model 4650 to characterize return loss to levels approaching -70 dB. This measurement is performed simultaneously with the loss and polarization measurements, requiring no additional time.
The Model 4650 quickly measures PDBW, PDCW and filter bandwidth.
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